2015

International Conference

[1] Eun-Hye Choi, Takashi Kitamura, Cyrille Artho, Akihisa Yamada, and Yutaka Oiwa, "Priority Integration for Weighted Combinatorial Testing", Proc. of the IEEE Computer Software and Applications Conference (COMPSAC2015), pp. 242--247, July 2015.

[2] Akihisa Yamada, Takashi Kitamura, Cyrille Artho, Eun-Hye Choi, Yutaka Oiwa, and Armin Biere, "Optimization of Combinatorial Testing by Incremental SAT Solving", Proc. of the IEEE International Conference on Software Testing, Verification, and Validation (ICST2015), April 2015.

[3] Takashi Kitamura, Akihisa Yamada, Goro Hatayama, Cyrille Artho, Eun-Hye Choi, Ngoc Do, Yutaka Oiwa, and Shinya Sakuragi, "Combinatorial Testing for Tree-Structured Test Models with Constraints", The 2015 International Conference on Software Quality, Reliability and Security (QRS), Best Paper, pp. 141--150, 2015.

2014

International Conference

[1] Eun-Hye Choi, Takashi Kitamura, Cyrille Artho, and Yutaka Oiwa, "Design of Prioritized N-Wise Testing", Proc. of the 26th IFIP International Conference on Testing Software and Systems (ICTSS2014), LNCS 8763, pp. 186--191, September 2014.

Domestic Conference

[1] Eun-Hye Choi, Takashi Kitamura, Cyrille Artho, Akihisa Yamada, and Yutaka Oiwa, "T-wise test construction improving (T+1)-way coverage", Poster Presentation in the 6th International Workshop of Software Engineering in Practice (IWESEP2014), November 2014.

[2] Yoriyuki Yamagata, Eun-Hye Choi, Ling Fang, Koji Hayamizu, Kenji Taguchi, Daisuke Soma, and Yutaka Oiwa, "電気ノイズによるマイクロコントローラ障害分析のための改良FMEA", 第44回信頼性・保全性シンポジウム 発表報文集,   2014.

Patent

[1] Eun-Hye Choi, Takashi Kitamura, Cyrille Artho, and Yutaka Oiwa, テスト方法及びテスト装置（特願2014-174852）,  August 2014.